Products
Ensuring product quality with OPTIVE's advanced inspection systems
OPTIVE Products
Providing customized inspection solutions for new semiconductor & FPD processes.
Wafer Inspection System
Semiconductor Wafer Inspection System
- Nanometer-level Defect Detection
- High-speed Automated Inspection Process
- AI-based Defect Analysis
Display Inspection
Display Inspection Solution
- OLED/LCD Panel Full Inspection
- Detection of Mura, Spots, Particles
- Real-time Quality Monitoring System
Smart Monitoring
AI-based Smart Monitoring
- Deep Learning Pattern Recognition
- Predictive Maintenance & Anomaly Detection
- Integrated Data Analysis Platform
3D Shape Inspection
3D Shape Inspection System
- Non-contact 3D Shape Measurement
- Nano meter level ultra Precision
- Compatible with Various Patterns
2/3D Complex Inspection SYSTEM
Improving productivity and accuracy simultaneously with an automated defect review system. Accurately detecting even minute defects through high-resolution imaging technology and AI-based analysis.
High-Speed Inspection
Applying large-area 3D optics surpassing existing technologies to maintain fast production speeds required by customers
Precision Analysis
High-precision system capable of detecting nanometer-level defects
AI-Based Classification
Automatic classification and analysis of defect types using machine learning algorithms
Inspection System
Ensuring product quality and minimizing defect rates with advanced inspection systems. Providing various inspection modes and real-time monitoring functions.
Multi-Mode Inspection
Implementing various 2D and 3D inspection/metrology with a single optical system
Real-Time Monitoring
Checking inspection results in real-time and enabling immediate response
Data Analysis
Collecting and analyzing inspection data to utilize for quality improvement
